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Simplify DDR validation with SI methods
As DDR memory technology evolves, DDR signal integrity becomes more challenging—hence, it is essential to use a proper probing method to obtain the best result. Details...
Avoid design snags with silicon contour predictor
Designers can improve parametric yield and chip performance by accurately determining the impact of systematic variations during design. Details...
Beat serial backplane interface design hurdles
Evolution of backplane system requirements in terms of rates and protocols is inevitable and engineers will face interface design challenges. Details...
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