Parametric probe cards reduce cost of tests at 45nm
Cascade Microtech has launched two new Pyramid parametric probe cards that allow single-pass high performance DC and RF measurements and reduce the cost of parametric production test for advanced process nodes at 65nm, 45nm and beyond. Details... more »
Why is effective isolation important during test?
According to Yeo Siok Been of Avago Technologies, safety isolation is important for test and measurement equipment to ensure data integrity and to protect test operators. Isolators are selected based on its speed performance and most importantly, based on its insulation levels and ratings to meet required safety standards. Details... more »
Solving PCIe compliance, interoperability issues
Since its inception more than five years ago, PCIe technology has become the dominant interconnect protocol across virtually all market segments. There are many challenges involved in verifying device compliance and interoperability. This article discusses these challenges, and proposes the Denali Puresuite Sofwtare Solution as the answer to them. Details... more »