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Intel, Infineon team for HD SIM cards
Intel and Infineon Technologi 5b4 es plan to start sampling a high-density SIM card in the second half of next year, with volume production scheduled for 2009. The companies announced a venture to develop the cards at the Cartes trade show taking place in Paris. Details... more »
Common multicore programming problems: Part 4 - Memory, cache issues and consistency
In the final of four articles on common multi-core programming problems, Shamee 5b4 m Akhter and Jason Roberts discuss how to conserve memory bandwidth, avoid contention problems and the importance of memory consistency Details... more »
Aeroflex adds JTAG/boundary scan option
Aeroflex has added integrated JTAG/boundary scan capabilities to its 5800 Series multi-configuration, multi-function Automatic Test Equipment (ATE) system. The PXI-based SCANFLEX platform from GOEPEL Electronic delivers structural device, board and system-level test access throughout the whole product life cycle without invasive bed-of-nail access. Details... more »
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